Characterisation

ANFF-SA has instrument suites in material and surface characterisation including atomic force, Raman and laser scanning microscopes, tomography, and optical profilometers.

 

These instruments can be used for:

  • material and surface characterisation

  • determining interaction forces

  • thin film thickness measurements and characterisation

  • 3D analysis of topologically complex structures

  • imaging of thick specimens at varying depths 


​Contact ANFF-SA facility manager Simon Doe on +61 8 8302 5226 for further information or to discuss your project needs.