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ANFF-SA has instrument suites in material and surface characterisation including atomic force, Raman and laser scanning microscopes, tomography, and optical profilometers.


These instruments can be used for:

  • material and surface characterisation

  • determining interaction forces

  • thin film thickness measurements and characterisation

  • 3D analysis of topologically complex structures

  • imaging of thick specimens at varying depths 

​Contact ANFF-SA facility manager Simon Doe on +61 8 8302 5226 for further information or to discuss your project needs. 

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