ANFF-SA has instrument suites in material and surface characterisation including atomic force, Raman and laser scanning microscopes, tomography, and optical profilometers.
These instruments can be used for:
material and surface characterisation
determining interaction forces
thin film thickness measurements and characterisation
3D analysis of topologically complex structures
imaging of thick specimens at varying depths
Contact ANFF-SA facility manager Simon Doe on +61 8 8302 5226 for further information or to discuss your project needs.